Built in Self Test of Transreceiver I/Q mismatch using PSK Technique

نویسندگان

  • K. Rajesh
  • Mrs.Ch. Sree Lakshmi
چکیده

Built-in self-test (BiST) for transmitters is a desirable choice since it eliminates the reliance on expensive instrumentation to perform radio-frequency signal analysis. Existing on-chip resources, such as power or envelope detectors or small additional circuitry, can be used for BiST purposes. However, due to limited bandwidth, measurement of complex specifications, such as in-phase and quadrature (IQ) imbalance, and thirdorder inter-modulation intercept point (IIP3) is challenging. Since IQ imbalances are most amenable for digital compensation, their characterization and monitoring are desirable. The paper focuses on design of PA base design in comparison with PSK demodulation technique for IQ base match and mismatch condition. All this is used reconfigurable design.

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تاریخ انتشار 2016